Pitfalls in survey measurements of economic parameters

Philip Thomas

doi:10.1088/1742-6596/1065/7/072009

Pitfalls in survey measurements of economic parameters

Philip Thomas

Research output: Contribution to journal › Article (Academic Journal) › peer-review

2 Citations (Scopus)

253 Downloads (Pure)

Abstract

Opinion surveys are sometimes used in attempts to measure important economic parameters in the absence of a free market. It is then important that the most rigorous standards are applied if the survey results are to be meaningful. The paper highlights new theoretical results in this field and documents examples where lack of rigour has led to serious consequences.

Original language	English
Article number	072009
Number of pages	5
Journal	Journal of Physics: Conference Series
Volume	1065
DOIs	https://doi.org/10.1088/1742-6596/1065/7/072009
Publication status	Published - 13 Nov 2018
Event	IMEKO 22nd World Congress Belfast 2018: Knowledge through Measurement - Belfast, United Kingdom Duration: 3 Sept 2018 → 6 Sept 2018 Conference number: 22

Keywords

Measurement, opinion surveys, structural view independence, LIBOR, VPF

Access to Document

10.1088/1742-6596/1065/7/072009

Full-text PDF (final published version)
This is the final published version of the article (version of record). It first appeared online via IOP Publishing Ltd at http://iopscience.iop.org/article/10.1088/1742-6596/1065/7/072009/meta . Please refer to any applicable terms of use of the publisher.
Final published version, 395 KBLicence: CC BY

Handle.net

Persistent link

Embargoed Document

Full-text PDF (accepted author manuscript)
Accepted author manuscript, 120 KB

Cite this

@article{9dd2862b85204c018f4245306af365a8,

title = "Pitfalls in survey measurements of economic parameters",

abstract = "Opinion surveys are sometimes used in attempts to measure important economic parameters in the absence of a free market. It is then important that the most rigorous standards are applied if the survey results are to be meaningful. The paper highlights new theoretical results in this field and documents examples where lack of rigour has led to serious consequences.",

keywords = "Measurement, opinion surveys, structural view independence, LIBOR, VPF",

author = "Philip Thomas",

year = "2018",

month = nov,

day = "13",

doi = "10.1088/1742-6596/1065/7/072009",

language = "English",

volume = "1065",

journal = "Journal of Physics: Conference Series",

issn = "1742-6588",

publisher = "IOP Publishing",

note = "IMEKO 22nd World Congress Belfast 2018 : Knowledge through Measurement ; Conference date: 03-09-2018 Through 06-09-2018",

}

TY - JOUR

T1 - Pitfalls in survey measurements of economic parameters

AU - Thomas, Philip

N1 - Conference code: 22

PY - 2018/11/13

Y1 - 2018/11/13

N2 - Opinion surveys are sometimes used in attempts to measure important economic parameters in the absence of a free market. It is then important that the most rigorous standards are applied if the survey results are to be meaningful. The paper highlights new theoretical results in this field and documents examples where lack of rigour has led to serious consequences.

AB - Opinion surveys are sometimes used in attempts to measure important economic parameters in the absence of a free market. It is then important that the most rigorous standards are applied if the survey results are to be meaningful. The paper highlights new theoretical results in this field and documents examples where lack of rigour has led to serious consequences.

KW - Measurement, opinion surveys, structural view independence, LIBOR, VPF

U2 - 10.1088/1742-6596/1065/7/072009

DO - 10.1088/1742-6596/1065/7/072009

M3 - Article (Academic Journal)

SN - 1742-6588

VL - 1065

JO - Journal of Physics: Conference Series

JF - Journal of Physics: Conference Series

M1 - 072009

T2 - IMEKO 22nd World Congress Belfast 2018

Y2 - 3 September 2018 through 6 September 2018

ER -

Pitfalls in survey measurements of economic parameters

Abstract

Keywords

Access to Document

Handle.net

Embargoed Document

Fingerprint

Cite this