Translated title of the contribution | Preface to recent developments in the electron microscopy of semiconductors |
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Original language | English |
Pages (from-to) | 209 - 209 |
Number of pages | 1 |
Journal | Journal of Electron Microscopy |
Volume | 49 |
Publication status | Published - 2000 |
Preface to recent developments in the electron microscopy of semiconductors
S Takeda, D Cherns
Research output: Contribution to journal › Article (Academic Journal) › peer-review