Preface to recent developments in the electron microscopy of semiconductors

S Takeda, D Cherns

Research output: Contribution to journalArticle (Academic Journal)peer-review

Translated title of the contributionPreface to recent developments in the electron microscopy of semiconductors
Original languageEnglish
Pages (from-to)209 - 209
Number of pages1
JournalJournal of Electron Microscopy
Volume49
Publication statusPublished - 2000

Bibliographical note

Publisher: Oxford University Press

Cite this