Preface to recent developments in the electron microscopy of semiconductors

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Translated title of the contribution	Preface to recent developments in the electron microscopy of semiconductors
Original language	English
Pages (from-to)	209 - 209
Number of pages	1
Journal	Journal of Electron Microscopy
Volume	49
Publication status	Published - 2000

Publisher: Oxford University Press

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@article{bda934b21e9d4a719a730a1f613c4701,

title = "Preface to recent developments in the electron microscopy of semiconductors",

author = "S Takeda and D Cherns",

note = "Publisher: Oxford University Press",

year = "2000",

language = "English",

volume = "49",

pages = "209 -- 209",

journal = "Journal of Electron Microscopy",

issn = "1477-9986",

publisher = "Japanese Society of Microscopy",

}