Preparation and analysis of strain-free uranium surfaces for electron and x-ray diffraction analysis

J. E. Sutcliffe, J. R. Petherbridge, T. Cartwright, R. Springell, T. B. Scott, J. E. Darnbrough

Research output: Contribution to journalArticle (Academic Journal)

2 Citations (Scopus)
54 Downloads (Pure)

Abstract

This work describes a methodology for producing high quality metallic surfaces from uranium primarily for characterisation and investigations involving electron backscatter diffraction. Electrochemical measurements have been conducted to inform ideal polishing conditions to produce surfaces free from strain, induced by mechanical polishing. A commonly used solution for the electropolishing of uranium, consisting in part of phosphoric acid, was used to conduct the electrochemical experiments and polishing. X-ray diffraction techniques focusing on the surface show low stresses and strains are exhibited within the material. This is mirrored in good quality electron backscatter diffraction.

Original languageEnglish
Article number109968
Number of pages8
JournalMaterials Characterization
Volume158
Early online date20 Oct 2019
DOIs
Publication statusPublished - 1 Dec 2019

Keywords

  • EBSD
  • Electropolishing
  • Uranium
  • XRD

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