| Translated title of the contribution | Preparation of location-specific thin foils from Fe-3% Si bi- and tri-crystals for examination in a FEG-SEM |
|---|---|
| Original language | English |
| Pages (from-to) | 147 - 153 |
| Number of pages | 7 |
| Journal | Ultramicroscopy |
| Volume | 109 |
| DOIs | |
| Publication status | Published - Jan 2009 |
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