Probing semiconductor interfaces by transmission electron microscopy

Research output: Contribution to journal › Article (Academic Journal) › peer-review

Translated title of the contribution	Probing semiconductor interfaces by transmission electron microscopy
Original language	English
Pages (from-to)	545 - 556
Number of pages	11
Journal	Philosophical Transactions of the Royal Society A: Physical and Engineering Sciences
Volume	344
Publication status	Published - 1993

Handle.net

@article{17c81a287fb34b6d8715d102f40d5531,

title = "Probing semiconductor interfaces by transmission electron microscopy",

author = "JW Steeds and D Cherns",

year = "1993",

language = "English",

volume = "344",

pages = "545 -- 556",

journal = "Philosophical Transactions of the Royal Society A: Physical and Engineering Sciences",

issn = "0962-8428",

publisher = "The Royal Society",

}

TY - JOUR

T1 - Probing semiconductor interfaces by transmission electron microscopy

AU - Steeds, JW

AU - Cherns, D

PY - 1993

Y1 - 1993

M3 - Article (Academic Journal)

SN - 0962-8428

VL - 344

SP - 545

EP - 556

JO - Philosophical Transactions of the Royal Society A: Physical and Engineering Sciences

JF - Philosophical Transactions of the Royal Society A: Physical and Engineering Sciences

ER -