Profiling Ge islands in Si by large angle convergent beam electron diffraction

D Cherns, AA Hovsepian, W Jaeger

Research output: Contribution to journalArticle (Academic Journal)peer-review

5 Citations (Scopus)
Translated title of the contributionProfiling Ge islands in Si by large angle convergent beam electron diffraction
Original languageEnglish
Pages (from-to)211 - 215
JournalJournal of Electron Microscopy
Volume47
Publication statusPublished - 1998

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