Translated title of the contribution | Profiling Ge islands in Si by large angle convergent beam electron diffraction |
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Original language | English |
Pages (from-to) | 211 - 215 |
Journal | Journal of Electron Microscopy |
Volume | 47 |
Publication status | Published - 1998 |
Profiling Ge islands in Si by large angle convergent beam electron diffraction
D Cherns, AA Hovsepian, W Jaeger
Research output: Contribution to journal › Article (Academic Journal) › peer-review
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Citations
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