Profiling of GeSi/Si strained layer superlattices by large angle convergent beam electron diffraction and electron holography

X-F Duan, PN Grigorieff, D Cherns, JW Steeds, C Sheng

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

Translated title of the contribution	Profiling of GeSi/Si strained layer superlattices by large angle convergent beam electron diffraction and electron holography
Original language	English
Title of host publication	Unknown
Pages	513 - 516
Number of pages	3
Volume	134
Publication status	Published - 1993

Conference Proceedings/Title of Journal: Inst. Phys. Conf. Ser

Cite this

@inproceedings{0c0a360807494d08b3e8e60f56181846,

title = "Profiling of GeSi/Si strained layer superlattices by large angle convergent beam electron diffraction and electron holography",

author = "X-F Duan and PN Grigorieff and D Cherns and JW Steeds and C Sheng",

note = "Conference Proceedings/Title of Journal: Inst. Phys. Conf. Ser",

year = "1993",

language = "English",

volume = "134",

pages = "513 -- 516",

booktitle = "Unknown",

}

TY - GEN

T1 - Profiling of GeSi/Si strained layer superlattices by large angle convergent beam electron diffraction and electron holography

AU - Duan, X-F

AU - Grigorieff, PN

AU - Cherns, D

AU - Steeds, JW

AU - Sheng, C

N1 - Conference Proceedings/Title of Journal: Inst. Phys. Conf. Ser

PY - 1993

Y1 - 1993

M3 - Conference Contribution (Conference Proceeding)

VL - 134

SP - 513

EP - 516

BT - Unknown

ER -