Translated title of the contribution | Profiling of GeSi/Si strained layer superlattices by large angle convergent beam electron diffraction and electron holography |
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Original language | English |
Title of host publication | Unknown |
Pages | 513 - 516 |
Number of pages | 3 |
Volume | 134 |
Publication status | Published - 1993 |
Profiling of GeSi/Si strained layer superlattices by large angle convergent beam electron diffraction and electron holography
X-F Duan, PN Grigorieff, D Cherns, JW Steeds, C Sheng
Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)