Profiling strain in thin buried layers by convergent beam electron diffraction techniques

D Cherns

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

Translated title of the contribution	Profiling strain in thin buried layers by convergent beam electron diffraction techniques
Original language	English
Title of host publication	IUCr Congress, Seattle, Washington, August 1996
Publication status	Published - 1996

Other page information: pC367-
Conference Proceedings/Title of Journal: Proc. of IUCr Congress, Seattle, Washington, August 1996

Handle.net

@inproceedings{15c7683a78a54c4583fbb49c02aa2b89,

title = "Profiling strain in thin buried layers by convergent beam electron diffraction techniques",

author = "D Cherns",

note = "Other page information: pC367- Conference Proceedings/Title of Journal: Proc. of IUCr Congress, Seattle, Washington, August 1996",

year = "1996",

language = "English",

booktitle = "IUCr Congress, Seattle, Washington, August 1996",

}

TY - GEN

T1 - Profiling strain in thin buried layers by convergent beam electron diffraction techniques

AU - Cherns, D

N1 - Other page information: pC367- Conference Proceedings/Title of Journal: Proc. of IUCr Congress, Seattle, Washington, August 1996

PY - 1996

Y1 - 1996

M3 - Conference Contribution (Conference Proceeding)

BT - IUCr Congress, Seattle, Washington, August 1996

ER -