Progressive failure site generation in AlGaN/GaN high electron mobility transistors under OFF-state stress: Weibull statistics and temperature dependence

Projects

Projects per year 2013 2013 2014 2017

• 2 Finished

Projects per year

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• GaN Electronics: RF Reliability and Degradation Mechanisms.

  Kuball, M. H. H.

  1/02/14 → 31/07/17

  Project: Research

  • High electron mobility transistors 100%
  • high electron mobility transistors 89%
  • hot electrons 80%
  • electroluminescence 77%
  • Electron Mobility 72%

• Novel High Thermal Conductivity Substrates for GaN Electronics: Thermal Innovation

  Kuball, M. H. H.

  8/07/13 → 8/10/16

  Project: Research

  • Diamonds 100%
  • diamonds 79%
  • high electron mobility transistors 77%
  • Thermal Resistance 60%
  • Electron Mobility 59%