Prospects for convergent beam electron diffraction with 200-300 kV cold field emission transmission electron microscopes

JW Steeds, R Vincent

Research output: Contribution to journalArticle (Academic Journal)

Translated title of the contributionProspects for convergent beam electron diffraction with 200-300 kV cold field emission transmission electron microscopes
Original languageEnglish
Pages (from-to)162 - 166
Number of pages4
JournalUltramicroscopy
Volume47
Publication statusPublished - 1992

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