| Translated title of the contribution | Prospects for convergent beam electron diffraction with 200-300 kV cold field emission transmission electron microscopes |
|---|---|
| Original language | English |
| Pages (from-to) | 162 - 166 |
| Number of pages | 4 |
| Journal | Ultramicroscopy |
| Volume | 47 |
| Publication status | Published - 1992 |
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