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Prospects for convergent beam electron diffraction with 200-300 kV cold field emission transmission electron microscopes

Research output: Contribution to journalArticle (Academic Journal)peer-review

Translated title of the contributionProspects for convergent beam electron diffraction with 200-300 kV cold field emission transmission electron microscopes
Original languageEnglish
Pages (from-to)162 - 166
Number of pages4
JournalUltramicroscopy
Volume47
Publication statusPublished - 1992

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