Ptychographic nanotomography at the Swiss Light Source

Manuel Guizar-Sicairos*, Mirko Holler, Ana Diaz, Julio C. Da Silva, Esther H R Tsai, Oliver Bunk, Carlos Martinez-Perez, Philip C J Donoghue, Charles H. Wellman, Andreas Menzel

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

4 Citations (Scopus)

Abstract

Ptychography combines elements of scanning probe microscopy with coherent diffractive imaging and provides a robust high-resolution imaging technique. The extension of X-ray ptychography to 3D provides nanoscale maps with quantitative contrast of the sample complex-valued refractive index. We present here progress in reconstruction and post-processing algorithms for ptychographic nanotomography, as well as outline advances in the implementation and development of dedicated instrumentation for fast and precise 3D scanning at the Swiss Light Source. Compared to the first demonstration in 2010, such developments have allowed a dramatic improvement in resolution and measurement speed, with direct impact in the application of the technique for biology and materials science. We showcase the technique by detailing the measurement and reconstruction of a fossilized dispersed spore.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
PublisherSociety of Photo-Optical Instrumentation Engineers (SPIE)
Volume9592
ISBN (Print)9781628417586
DOIs
Publication statusPublished - 2015
EventX-Ray Nanoimaging: Instruments and Methods II - San Diego, United States
Duration: 12 Aug 201513 Aug 2015

Conference

ConferenceX-Ray Nanoimaging: Instruments and Methods II
CountryUnited States
CitySan Diego
Period12/08/1513/08/15

Keywords

  • Computed tomography
  • Phase retrieval
  • Ptychography
  • Synchrotron radiation
  • X-ray imaging

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