Abstract
Ptychography combines elements of scanning probe microscopy with coherent diffractive imaging and provides a robust high-resolution imaging technique. The extension of X-ray ptychography to 3D provides nanoscale maps with quantitative contrast of the sample complex-valued refractive index. We present here progress in reconstruction and post-processing algorithms for ptychographic nanotomography, as well as outline advances in the implementation and development of dedicated instrumentation for fast and precise 3D scanning at the Swiss Light Source. Compared to the first demonstration in 2010, such developments have allowed a dramatic improvement in resolution and measurement speed, with direct impact in the application of the technique for biology and materials science. We showcase the technique by detailing the measurement and reconstruction of a fossilized dispersed spore.
Original language | English |
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Title of host publication | Proceedings of SPIE - The International Society for Optical Engineering |
Publisher | Society of Photo-Optical Instrumentation Engineers (SPIE) |
Volume | 9592 |
ISBN (Print) | 9781628417586 |
DOIs | |
Publication status | Published - 2015 |
Event | X-Ray Nanoimaging: Instruments and Methods II - San Diego, United States Duration: 12 Aug 2015 → 13 Aug 2015 |
Conference
Conference | X-Ray Nanoimaging: Instruments and Methods II |
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Country | United States |
City | San Diego |
Period | 12/08/15 → 13/08/15 |
Keywords
- Computed tomography
- Phase retrieval
- Ptychography
- Synchrotron radiation
- X-ray imaging