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Pulsed Large Signal RF Performance of Field-Plated Ga2O3 MOSFETs

  • Manikant Singh
  • , Michael A. Casbon
  • , Michael J. Uren
  • , James W. Pomeroy
  • , Stefano Dalcanale
  • , Serge Karboyan
  • , Paul J. Tasker
  • , Man Hoi Wong
  • , Kohei Sasaki
  • , Akito Kuramata
  • , Shigenobu Yamakoshi
  • , Masataka Higashiwaki
  • , Martin Kuball

Research output: Contribution to journalArticle (Academic Journal)peer-review

78 Citations (Scopus)
374 Downloads (Pure)

Abstract

Comparison between pulsed and CW large signal RF performance of field-plated β -Ga 2 O 3 MOSFETs has been reported. Reduced self-heating when pulse resulted in a power added efficiency of 12%, drain efficiency of 22.4%, output power density of 0.13 W/mm, and maximum gain up to 4.8 dB at 1 GHz for a 2- μm gate length device. Increased power dissipation for higher VDS and IDS resulted in a degradation in performance, which, thermal simulation showed, could be entirely explained by self-heating. Buffer and surface trapping contributions have been evaluated using gate and drain lag measurements, showing minimal impact on device performance. These results suggest that β -Ga 2 O 3 is a good candidate for future RF applications.
Original languageEnglish
Pages (from-to)1572-1575
Number of pages4
JournalIEEE Electron Device Letters
Volume39
Issue number10
Early online date16 Aug 2018
DOIs
Publication statusPublished - Oct 2018

Research Groups and Themes

  • CDTR

Keywords

  • Ga2O3 MOSFET
  • large signal RF
  • power added efficiency (PAE)
  • pulsed IV
  • pulsed RF

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