Quantitative convergent beam electron diffraction measurements of low-order structure factors in nickel

M Saunders, AG Fox, PA Midgley

Research output: Contribution to journal › Article (Academic Journal) › peer-review

Translated title of the contribution	Quantitative convergent beam electron diffraction measurements of low-order structure factors in nickel
Original language	English
Pages (from-to)	1013-1014
Number of pages	2
Journal	Proceedings: Microscopy and Microanalysis
Volume	3
Issue number	Supplement 2
Publication status	Published - 1997

Cite this

@article{f90a982a6d794bd1a8f1682dd1653e66,

title = "Quantitative convergent beam electron diffraction measurements of low-order structure factors in nickel",

author = "M Saunders and AG Fox and PA Midgley",

year = "1997",

language = "English",

volume = "3",

pages = "1013--1014",

journal = "Proceedings: Microscopy and Microanalysis",

issn = "1083-0375",

publisher = "Cambridge University Press",

number = "Supplement 2",

}

TY - JOUR

T1 - Quantitative convergent beam electron diffraction measurements of low-order structure factors in nickel

AU - Saunders, M

AU - Fox, AG

AU - Midgley, PA

PY - 1997

Y1 - 1997

M3 - Article (Academic Journal)

VL - 3

SP - 1013

EP - 1014

JO - Proceedings: Microscopy and Microanalysis

JF - Proceedings: Microscopy and Microanalysis

SN - 1083-0375

IS - Supplement 2

ER -