Translated title of the contribution | Quantitative convergent beam electron diffraction measurements of low-order structure factors in nickel |
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Original language | English |
Pages (from-to) | 1013-1014 |
Number of pages | 2 |
Journal | Proceedings: Microscopy and Microanalysis |
Volume | 3 |
Issue number | Supplement 2 |
Publication status | Published - 1997 |
Quantitative convergent beam electron diffraction measurements of low-order structure factors in nickel
M Saunders, AG Fox, PA Midgley
Research output: Contribution to journal › Article (Academic Journal) › peer-review