| Translated title of the contribution | Quantitative measurement of symmetry in CBED patterns |
|---|---|
| Original language | English |
| Title of host publication | Unknown |
| Pages | 141 - 144 |
| Volume | 153 |
| Publication status | Published - 1997 |
Bibliographical note
Conference Proceedings/Title of Journal: Electron Microscopy and Analysis 1997, IOP Conf. SerCite this
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