Abstract
Dynamical mean-field theory (DMFT) has been employed in conjunction with density functional theory (DFT + DMFT) to investigate the metal-insulator transition (MIT) of strongly correlated 3d electrons due to quantum confinement. We shed light on the microscopic mechanism of the MIT and previously reported anomalous subband mass enhancement, both of which arise as a direct consequence of the quantization of V xz(yz) states in the SrVO3 layers. We therefore show that quantum confinement can sensitively tune the strength of electron correlations, leading the way to applying such approaches in other correlated materials.
Original language | English |
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Article number | 023149 |
Number of pages | 14 |
Journal | Physical Review Research |
Volume | 3 |
Issue number | 2 |
Early online date | 26 May 2021 |
DOIs | |
Publication status | Published - Jun 2021 |
Bibliographical note
Publisher Copyright:© 2021 authors. Published by the American Physical Society. Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI.
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Dive into the research topics of 'Quantum confinement induced metal-insulator transition in strongly correlated quantum wells of SrVO3 superlattices'. Together they form a unique fingerprint.Student theses
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The effect of local correlations on the wave functions and experiment-theory comparisons within strongly and weakly correlated materials
James, A. D. N. (Author), Dugdale, S. (Supervisor), 11 May 2021Student thesis: Doctoral Thesis › Doctor of Philosophy (PhD)
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Datasets
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SrVO3/SrTiO3 DFT+DMFT data
Laverock, J. (Creator) & James, A. (Creator), University of Bristol, 13 May 2021
DOI: 10.5523/bris.1n5ra5bhdim102ct2wb6ehfojw, http://data.bris.ac.uk/data/dataset/1n5ra5bhdim102ct2wb6ehfojw
Dataset
Equipment
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HPC (High Performance Computing) and HTC (High Throughput Computing) Facilities
Alam, S. R. (Manager), Eccleston, P. E. (Other), Williams, D. A. G. (Manager) & Atack, S. H. (Other)
Facility/equipment: Facility