Quantum-gate characterization in an extended Hilbert space

Rohde P.P., Ralph T.C., Pryde G.J., JL O'Brien

Research output: Contribution to journalArticle (Academic Journal)peer-review

24 Citations (Scopus)


We describe an approach for characterizing the process performed by a quantum gate using quantum process tomography, by first modeling the gate in an extended Hilbert space, which includes nonqubit degrees of freedom. To prevent unphysical processes from being predicted, present quantum process tomography procedures incorporate mathematical constraints, which make no assumptions as to the actual physical nature of the system being described. By contrast, the procedure presented here assumes a particular class of physical processes, and enforces physicality by fitting the data to this model. This allows quantum process tomography to be performed using a smaller experimental data set, and produces parameters with a direct physical interpretation. The approach is demonstrated by example of mode matching in an all-optical controlled-NOT gate. The techniques described are general and could be applied to other optical circuits or quantum computing architectures
Translated title of the contributionQuantum-gate characterization in an extended Hilbert space
Original languageEnglish
Pages (from-to)32306-1 - 32306-5
Number of pages5
JournalPhysical Review A: Atomic, Molecular and Optical Physics
Volume72 (3)
Publication statusPublished - Sep 2005

Bibliographical note

Publisher: APS through AIP

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