Quantum gate characterization in an extended Hilbert space

PP Rohde, GJ Pryde, JL O'Brien, TC Ralph

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

Abstract

We describe an approach for characterizing optical quantum gates, by constructing models which incorporate mode-matching effects. Quantum process tomography is then performed on the model. The techniques can be generalized to other quantum computing architectures.
Translated title of the contributionQuantum gate characterization in an extended Hilbert space
Original languageEnglish
Title of host publicationQuantum Electronics and Laser Science Conference, 2005 (QELS '05), Baltiimore, USA
Pages7 - 9
Number of pages3
Volume1
DOIs
Publication statusPublished - 22 May 2005

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