Abstract
We describe an approach for characterizing optical quantum gates, by constructing models which incorporate mode-matching effects. Quantum process tomography is then performed on the model. The techniques can be generalized to other quantum computing architectures.
Translated title of the contribution | Quantum gate characterization in an extended Hilbert space |
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Original language | English |
Title of host publication | Quantum Electronics and Laser Science Conference, 2005 (QELS '05), Baltiimore, USA |
Pages | 7 - 9 |
Number of pages | 3 |
Volume | 1 |
DOIs | |
Publication status | Published - 22 May 2005 |