Quantum gate characterization in an extended Hilbert space

PP Rohde; GJ Pryde; JL O'Brien; TC Ralph

doi:10.1109/QELS.2005.1548656

Quantum gate characterization in an extended Hilbert space

PP Rohde, GJ Pryde, JL O'Brien, TC Ralph

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

Abstract

We describe an approach for characterizing optical quantum gates, by constructing models which incorporate mode-matching effects. Quantum process tomography is then performed on the model. The techniques can be generalized to other quantum computing architectures.

Translated title of the contribution	Quantum gate characterization in an extended Hilbert space
Original language	English
Title of host publication	Quantum Electronics and Laser Science Conference, 2005 (QELS '05), Baltiimore, USA
Pages	7 - 9
Number of pages	3
Volume	1
DOIs	https://doi.org/10.1109/QELS.2005.1548656
Publication status	Published - 22 May 2005

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title = "Quantum gate characterization in an extended Hilbert space",

abstract = "We describe an approach for characterizing optical quantum gates, by constructing models which incorporate mode-matching effects. Quantum process tomography is then performed on the model. The techniques can be generalized to other quantum computing architectures.",

author = "PP Rohde and GJ Pryde and JL O'Brien and TC Ralph",

year = "2005",

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doi = "10.1109/QELS.2005.1548656",

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AU - Ralph, TC

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N2 - We describe an approach for characterizing optical quantum gates, by constructing models which incorporate mode-matching effects. Quantum process tomography is then performed on the model. The techniques can be generalized to other quantum computing architectures.

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DO - 10.1109/QELS.2005.1548656

M3 - Conference Contribution (Conference Proceeding)

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EP - 9

BT - Quantum Electronics and Laser Science Conference, 2005 (QELS '05), Baltiimore, USA

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