We describe an approach for characterizing optical quantum gates, by constructing models which incorporate mode-matching effects. Quantum process tomography is then performed on the model. The techniques can be generalized to other quantum computing architectures.
|Translated title of the contribution||Quantum gate characterization in an extended Hilbert space|
|Title of host publication||Quantum Electronics and Laser Science Conference, 2005 (QELS '05), Baltiimore, USA|
|Pages||7 - 9|
|Number of pages||3|
|Publication status||Published - 22 May 2005|