Raman measurement methods for strain and subsurface damage down to 0.1 μm

GD Pitt

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

Translated title of the contribution	Raman measurement methods for strain and subsurface damage down to 0.1 μm
Original language	English
Title of host publication	IEE Colloquium on Methods of Materials Measurement in Microengineering, IEE, London 30 Nov. 1995, Digest No. 1995/227
Publisher	Institution of Engineering and Technology (IET)
Pages	61 - 62
Publication status	Published - 1996

Handle.net

@inproceedings{e283b1149e8349b7b22d4165ef9e0332,

title = "Raman measurement methods for strain and subsurface damage down to 0.1 μm",

author = "GD Pitt",

year = "1996",

language = "English",

pages = "61 -- 62",

booktitle = "IEE Colloquium on Methods of Materials Measurement in Microengineering, IEE, London 30 Nov. 1995, Digest No. 1995/227",

publisher = "Institution of Engineering and Technology (IET)",

address = "United Kingdom",

}

Raman measurement methods for strain and subsurface damage down to 0.1 μm. / Pitt, GD.
IEE Colloquium on Methods of Materials Measurement in Microengineering, IEE, London 30 Nov. 1995, Digest No. 1995/227. Institution of Engineering and Technology (IET), 1996. p. 61 - 62.

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

TY - GEN

T1 - Raman measurement methods for strain and subsurface damage down to 0.1 μm

AU - Pitt, GD

PY - 1996

Y1 - 1996

M3 - Conference Contribution (Conference Proceeding)

SP - 61

EP - 62

BT - IEE Colloquium on Methods of Materials Measurement in Microengineering, IEE, London 30 Nov. 1995, Digest No. 1995/227

PB - Institution of Engineering and Technology (IET)

ER -