Raman spectroscopy of ion irradiated SiC: chemical defects, strain, annealing, and oxidation

Alexander J. Leide, Matthew J. Lloyd, Richard I. Todd, David E. J. Armstrong

Research output: Contribution to journalArticle (Academic Journal)

Fingerprint

Dive into the research topics of 'Raman spectroscopy of ion irradiated SiC: chemical defects, strain, annealing, and oxidation'. Together they form a unique fingerprint.

Material Science

Engineering