Rapid Characterization of GaN-on-diamond Interfacial Thermal Resistance Using Contactless Transient Thermoreflectance

Huarui Sun; James Pomeroy; Roland B. Simon; Daniel Francis; Firooz Faili; Daniel J. Twitchen; Martin Kuball

Rapid Characterization of GaN-on-diamond Interfacial Thermal Resistance Using Contactless Transient Thermoreflectance

Huarui Sun, James Pomeroy, Roland B. Simon, Daniel Francis, Firooz Faili, Daniel J. Twitchen, Martin Kuball

School of Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

7 Citations (Scopus)

56 Downloads (Pure)

Abstract

Reducing GaN-on-diamond interfacial thermal resistance is crucial to maximize the thermal benefit of diamond substrates for high power transistor applications. In this work, we demonstrate a rapid, contactless transient thermoreflectance technique to assess the interfacial thermal resistance of as-grown GaN-on-diamond wafers.

Original language	English
Title of host publication	Proceedings of 2015 International Conference on Compound Semiconductor Manufacturing Technology (CS MANTECH)
Subtitle of host publication	May 18th - 21st, 2015, Scottsdale, Arizona, USA
Publisher	CS Mantech
Pages	151-153
Number of pages	3
Publication status	Published - May 2015
Event	2015 International Conference on Compound Semiconductor Manufacturing Technology (CS MANTECH) - Arizona, Scottsdale, United States Duration: 18 May 2015 → 21 May 2015

Conference

Conference	2015 International Conference on Compound Semiconductor Manufacturing Technology (CS MANTECH)
Country/Territory	United States
City	Scottsdale
Period	18/05/15 → 21/05/15

Structured keywords

CDTR

Keywords

GaN-on-diamond
TBReff
Transient thermoreflectance

Access to Document

http://www.csmantech.org/Digests/2015/papers/8.2-043.pdf

Handle.net

Persistent link

Cite this

Sun, H., Pomeroy, J., Simon, R. B., Francis, D., Faili, F., Twitchen, D. J., & Kuball, M. (2015). Rapid Characterization of GaN-on-diamond Interfacial Thermal Resistance Using Contactless Transient Thermoreflectance. In Proceedings of 2015 International Conference on Compound Semiconductor Manufacturing Technology (CS MANTECH): May 18th - 21st, 2015, Scottsdale, Arizona, USA (pp. 151-153). CS Mantech. http://www.csmantech.org/Digests/2015/papers/8.2-043.pdf

@inproceedings{1e1dd66cd94643f9a18db0168d62682c,

title = "Rapid Characterization of GaN-on-diamond Interfacial Thermal Resistance Using Contactless Transient Thermoreflectance",

abstract = "Reducing GaN-on-diamond interfacial thermal resistance is crucial to maximize the thermal benefit of diamond substrates for high power transistor applications. In this work, we demonstrate a rapid, contactless transient thermoreflectance technique to assess the interfacial thermal resistance of as-grown GaN-on-diamond wafers.",

keywords = "GaN-on-diamond, TBReff, Transient thermoreflectance",

author = "Huarui Sun and James Pomeroy and Simon, {Roland B.} and Daniel Francis and Firooz Faili and Twitchen, {Daniel J.} and Martin Kuball",

year = "2015",

month = may,

language = "English",

pages = "151--153",

booktitle = "Proceedings of 2015 International Conference on Compound Semiconductor Manufacturing Technology (CS MANTECH)",

publisher = "CS Mantech",

note = "2015 International Conference on Compound Semiconductor Manufacturing Technology (CS MANTECH) ; Conference date: 18-05-2015 Through 21-05-2015",

}

Sun, H, Pomeroy, J, Simon, RB, Francis, D, Faili, F, Twitchen, DJ & Kuball, M 2015, Rapid Characterization of GaN-on-diamond Interfacial Thermal Resistance Using Contactless Transient Thermoreflectance. in Proceedings of 2015 International Conference on Compound Semiconductor Manufacturing Technology (CS MANTECH): May 18th - 21st, 2015, Scottsdale, Arizona, USA. CS Mantech, pp. 151-153, 2015 International Conference on Compound Semiconductor Manufacturing Technology (CS MANTECH), Scottsdale, United States, 18/05/15. <http://www.csmantech.org/Digests/2015/papers/8.2-043.pdf>

Rapid Characterization of GaN-on-diamond Interfacial Thermal Resistance Using Contactless Transient Thermoreflectance. / Sun, Huarui; Pomeroy, James; Simon, Roland B. et al.

Proceedings of 2015 International Conference on Compound Semiconductor Manufacturing Technology (CS MANTECH): May 18th - 21st, 2015, Scottsdale, Arizona, USA. CS Mantech, 2015. p. 151-153.

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

TY - GEN

T1 - Rapid Characterization of GaN-on-diamond Interfacial Thermal Resistance Using Contactless Transient Thermoreflectance

AU - Sun, Huarui

AU - Pomeroy, James

AU - Simon, Roland B.

AU - Francis, Daniel

AU - Faili, Firooz

AU - Twitchen, Daniel J.

AU - Kuball, Martin

PY - 2015/5

Y1 - 2015/5

N2 - Reducing GaN-on-diamond interfacial thermal resistance is crucial to maximize the thermal benefit of diamond substrates for high power transistor applications. In this work, we demonstrate a rapid, contactless transient thermoreflectance technique to assess the interfacial thermal resistance of as-grown GaN-on-diamond wafers.

AB - Reducing GaN-on-diamond interfacial thermal resistance is crucial to maximize the thermal benefit of diamond substrates for high power transistor applications. In this work, we demonstrate a rapid, contactless transient thermoreflectance technique to assess the interfacial thermal resistance of as-grown GaN-on-diamond wafers.

KW - GaN-on-diamond

KW - TBReff

KW - Transient thermoreflectance

M3 - Conference Contribution (Conference Proceeding)

SP - 151

EP - 153

BT - Proceedings of 2015 International Conference on Compound Semiconductor Manufacturing Technology (CS MANTECH)

PB - CS Mantech

T2 - 2015 International Conference on Compound Semiconductor Manufacturing Technology (CS MANTECH)

Y2 - 18 May 2015 through 21 May 2015

ER -

Sun H, Pomeroy J, Simon RB, Francis D, Faili F, Twitchen DJ et al. Rapid Characterization of GaN-on-diamond Interfacial Thermal Resistance Using Contactless Transient Thermoreflectance. In Proceedings of 2015 International Conference on Compound Semiconductor Manufacturing Technology (CS MANTECH): May 18th - 21st, 2015, Scottsdale, Arizona, USA. CS Mantech. 2015. p. 151-153

Rapid Characterization of GaN-on-diamond Interfacial Thermal Resistance Using Contactless Transient Thermoreflectance

Abstract

Conference

Structured keywords

Keywords

Access to Document

Handle.net

Fingerprint

Cite this