Rapid Characterization of GaN-on-diamond Interfacial Thermal Resistance Using Contactless Transient Thermoreflectance

Huarui Sun, James Pomeroy, Roland B. Simon, Daniel Francis, Firooz Faili, Daniel J. Twitchen, Martin Kuball

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

5 Citations (Scopus)
56 Downloads (Pure)

Abstract

Reducing GaN-on-diamond interfacial thermal resistance is crucial to maximize the thermal benefit of diamond substrates for high power transistor applications. In this work, we demonstrate a rapid, contactless transient thermoreflectance technique to assess the interfacial thermal resistance of as-grown GaN-on-diamond wafers.
Original languageEnglish
Title of host publicationProceedings of 2015 International Conference on Compound Semiconductor Manufacturing Technology (CS MANTECH)
Subtitle of host publicationMay 18th - 21st, 2015, Scottsdale, Arizona, USA
PublisherCS Mantech
Pages151-153
Number of pages3
Publication statusPublished - May 2015
Event2015 International Conference on Compound Semiconductor Manufacturing Technology (CS MANTECH) - Arizona, Scottsdale, United States
Duration: 18 May 201521 May 2015

Conference

Conference2015 International Conference on Compound Semiconductor Manufacturing Technology (CS MANTECH)
CountryUnited States
CityScottsdale
Period18/05/1521/05/15

Structured keywords

  • CDTR

Keywords

  • GaN-on-diamond
  • TBReff
  • Transient thermoreflectance

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