Reflector analysis for novel OTA test method

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

Abstract

The use of millimetre waves (mmWaves) have required the design of novel OTA test methods. A low-cost OTA methodology based on elliptical cylindrical reflector takes advantage of the reflective properties of the ellipse to perform conformance test of devices operating at mmWaves. Two types of flat reflectors have been compared to quantify the effect that deformations in their surfaces, in the order of millimetres, produce in the reflected signal at 24 GHz. The signal amplitude reflected from a copper substrate reflector, with a total height variation (THV) in its surface of 2.73 mm, is 3.2 dB lower than the signal amplitude reflected by a rigid certified (reference) aluminium cast tooling plate with a THV of 0.46 mm under the same conditions. In addition, the half power beamwidth (HPBW) of the reference reflector is 1° smaller than the HPBW produced by the substrate plate.

Original languageEnglish
Title of host publication15th European Conference on Antennas and Propagation, EuCAP 2021
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
ISBN (Electronic)9788831299022
DOIs
Publication statusPublished - 22 Mar 2021
Event15th European Conference on Antennas and Propagation, EuCAP 2021 - Dusseldorf, Germany
Duration: 22 Mar 202126 Mar 2021

Publication series

Name15th European Conference on Antennas and Propagation, EuCAP 2021

Conference

Conference15th European Conference on Antennas and Propagation, EuCAP 2021
Country/TerritoryGermany
CityDusseldorf
Period22/03/2126/03/21

Bibliographical note

Publisher Copyright:
© 2021 EurAAP.

Keywords

  • Flatness
  • OTA
  • reflection
  • surface roughness

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