Abstract
Gas leaks present an undeniable safety concern, the ability to swiftly and accurately detect the source of a leak and pertinent details is critical for effective emergency response. The limited precision of sensors and environmental noise introduce significant uncertainty and randomness, complicating the resolution of such issues. To address these challenges, this study introduces a new approach that integrates multi-step deep reinforcement learning algorithms with Bayesian inference to estimate source information. Compared to single-step Reinforcement Learning and Entrotaxis methods, the multi-step update mechanism in this problem allows the agent to locate sources position more efficiently. This approach not only increases the search’s success rate but also decreases the number of time steps needed for successful detection. Experiments conducted in continuous and discrete environments of equal scale and parameters corroborate the efficiency of our method in tracing the source of gas leaks.
| Original language | English |
|---|---|
| Title of host publication | 2024 IEEE International Conference on Industrial Technology (ICIT) |
| Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
| Number of pages | 9 |
| ISBN (Electronic) | 9798350340266 |
| ISBN (Print) | 9798350340273 |
| DOIs | |
| Publication status | Published - 5 Jun 2024 |
| Event | 2024 ICIT – 25th IEEE International Conference on Industrial Technology - Bristol, United Kingdom Duration: 25 Mar 2024 → 27 Mar 2024 https://iten.ieee-ies.org/past-events/2023/2024-icit-25th-ieee-international-conference-on-industrial-technology/ |
Publication series
| Name | IEEE International Conference on Industrial Technology |
|---|---|
| Publisher | IEEE |
| ISSN (Print) | 2641-0184 |
| ISSN (Electronic) | 2643-2978 |
Conference
| Conference | 2024 ICIT – 25th IEEE International Conference on Industrial Technology |
|---|---|
| Abbreviated title | ICIT 2024 |
| Country/Territory | United Kingdom |
| City | Bristol |
| Period | 25/03/24 → 27/03/24 |
| Internet address |
Bibliographical note
Publisher Copyright:© 2024 IEEE.
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