Reliability Analysis of H-Tree Random Access Memories Implemented With Built in Current Sensors and Parity Codes for Multiple Bit Upset Correction

Costas Argyrides*, Raul Chipana, Fabian Vargas, Dhiraj K. Pradhan

*Corresponding author for this work

Research output: Contribution to journal › Article (Academic Journal) › peer-review

15 Citations (Scopus)

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