Reliability Aware Yield Improvement Technique for Nanotechnology Based Circuits

Argyrides Costas, Dimosthenous Giorgos, Lisboa Carlos, Carro Luigi, Dhiraj Pradhan

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

Translated title of the contributionReliability Aware Yield Improvement Technique for Nanotechnology Based Circuits
Original languageEnglish
Title of host publication22nd annual symposium on Integrated circuits and system design SBCCI ‘09
Publication statusPublished - 2009

Bibliographical note

Other page information: -
Conference Proceedings/Title of Journal: 22nd annual symposium on Integrated circuits and system design SBCCI ‘09
Other identifier: 2001052

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