| Translated title of the contribution | Reliability Aware Yield Improvement Technique for Nanotechnology Based Circuits |
|---|---|
| Original language | English |
| Title of host publication | 22nd annual symposium on Integrated circuits and system design SBCCI ‘09 |
| Publication status | Published - 2009 |
Bibliographical note
Other page information: -Conference Proceedings/Title of Journal: 22nd annual symposium on Integrated circuits and system design SBCCI ‘09
Other identifier: 2001052