Translated title of the contribution | Reliability of high-speed devices: Probing of self-heating with nanosecond time-resolution |
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Original language | English |
Title of host publication | CS MANTECH Conference |
Subtitle of host publication | May 14-17, 2007, Austin, Texas, USA |
Pages | 55-58 |
Publication status | Published - 2007 |
Bibliographical note
Conference Proceedings/Title of Journal: Digest 2007Conference Organiser: CS ManTech
Research Groups and Themes
- CDTR