Reliability of high-speed devices: Probing of self-heating with nanosecond time-resolution

M Kuball, G Riedel, JW Pomeroy, A Sarua, MJ Uren, T Martin, KP Hilton, JO Maclean, DJ Wallis

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

1 Citation (Scopus)
Translated title of the contributionReliability of high-speed devices: Probing of self-heating with nanosecond time-resolution
Original languageEnglish
Title of host publicationCS MANTECH Conference
Subtitle of host publicationMay 14-17, 2007, Austin, Texas, USA
Pages55-58
Publication statusPublished - 2007

Bibliographical note

Conference Proceedings/Title of Journal: Digest 2007
Conference Organiser: CS ManTech

Structured keywords

  • CDTR

Cite this