Translated title of the contribution | Reliable Network-on-Chip Based on Generalized de Bruijn Graph |
---|---|
Original language | English |
Title of host publication | IEEE International High Level Design Validation and Test Workshop (HLDVT) (to appear) |
Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
Publication status | Published - 2007 |
Bibliographical note
Other page information: -Conference Proceedings/Title of Journal: IEEE International High Level Design Validation and Test Workshop (HLDVT) (to appear)
Other identifier: 2000766