Resonant inelastic x-ray scattering from U3O8 and UN

Eleanor Lawrence Bright*, Lei Xu, Lottie M Harding, Ross S Springell, Andrew Walters, Martin Sundermann, Mirian Garcia-Fernandez, Stefano Agrestini, Roberto Caciuffo, Gerrit van der Laan, Gerard H Lander

*Corresponding author for this work

Research output: Contribution to journalArticle (Academic Journal)peer-review

4 Citations (Scopus)

Abstract

Resonant inelastic x-ray scattering (RIXS) using an incident energy tuned to the uranium $N_{4,5}$ absorption edges is reported from epitaxial films of α-U3O8 and UN. Theory shows that for U3O8 the multiplets associated with a 5f1 configuration with a ground state of $^2F_{5/2}$ and the excited state of $^2F_{7/2}$ are observed. However, the strong transition predicted at a transfer energy of 1.67 eV is not observed. We assume this is a consequence of the intermediate state lifetime broadening due to interaction with continuum states when the transferred energy exceeds the onset of the continuum in the presence of the core hole. This hypothesis is supported by the results obtained for the 5f-itinerant system UN, where no sharp transitions have been observed, although the broad scattering response centred at ∼1 eV is considered a signature of a predominantly 5f3 configuration in this band-like semi-metallic system. These experiments and theory add important information on these materials, both of which have been investigated since the 1960s, as well as whether RIXS at the uranium N edge can become a valuable tool for actinide research.
Original languageEnglish
Article number175501
JournalJournal of Physics: Condensed Matter
Volume35
Issue number17
DOIs
Publication statusPublished - 28 Feb 2023

Bibliographical note

Funding Information:
We acknowledge Diamond Light Source for time on beamline I21 under Proposal MM29274. L X thanks Enrique R Batista and Ping Yang for fruitful discussions.

Publisher Copyright:
© 2023 IOP Publishing Ltd.

Keywords

  • Uranium
  • Uranium oxides
  • Uranium nitride
  • RIXS
  • X-ray
  • Resonant inelastic x-ray scattering
  • Thin film
  • Epitaxial growth

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