RF waveform metrology for characterization of non-linear amplifiers

DA Humphreys, GT Watkins, KA Morris, J Miall

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

2 Citations (Scopus)

Abstract

Radio Frequency Waveform metrology (RFWM), based on real-time digital oscilloscopes, was used to evaluate the performance of a non-linear E-class amplifier optimized for WCDMA at 840 MHz. A timing error in the modulation signal gave abnormally high EVM values when measured using commercial equipment. The EVM of the source and amplifier were estimated as 0.4% and 2% respectively using RFWM. Simple RFWM evaluation tools show amplifier distortion and may offer insights over parametric measures.
Translated title of the contributionRF waveform metrology for characterization of non-linear amplifiers
Original languageEnglish
Title of host publication72nd ARFTG Microwave Measurement Symposium, Portland, USA
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages69 - 72
Number of pages4
ISBN (Print)9781424423002
DOIs
Publication statusPublished - 9 Dec 2008

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