RF waveform metrology for characterization of non-linear amplifiers

DA Humphreys; GT Watkins; KA Morris; J Miall

doi:10.1109/ARFTG.2008.4804285

RF waveform metrology for characterization of non-linear amplifiers

DA Humphreys, GT Watkins, KA Morris, J Miall

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

2 Citations (Scopus)

Abstract

Radio Frequency Waveform metrology (RFWM), based on real-time digital oscilloscopes, was used to evaluate the performance of a non-linear E-class amplifier optimized for WCDMA at 840 MHz. A timing error in the modulation signal gave abnormally high EVM values when measured using commercial equipment. The EVM of the source and amplifier were estimated as 0.4% and 2% respectively using RFWM. Simple RFWM evaluation tools show amplifier distortion and may offer insights over parametric measures.

Translated title of the contribution	RF waveform metrology for characterization of non-linear amplifiers
Original language	English
Title of host publication	72nd ARFTG Microwave Measurement Symposium, Portland, USA
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	69 - 72
Number of pages	4
ISBN (Print)	9781424423002
DOIs	https://doi.org/10.1109/ARFTG.2008.4804285
Publication status	Published - 9 Dec 2008

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title = "RF waveform metrology for characterization of non-linear amplifiers",

abstract = "Radio Frequency Waveform metrology (RFWM), based on real-time digital oscilloscopes, was used to evaluate the performance of a non-linear E-class amplifier optimized for WCDMA at 840 MHz. A timing error in the modulation signal gave abnormally high EVM values when measured using commercial equipment. The EVM of the source and amplifier were estimated as 0.4% and 2% respectively using RFWM. Simple RFWM evaluation tools show amplifier distortion and may offer insights over parametric measures.",

author = "DA Humphreys and GT Watkins and KA Morris and J Miall",

year = "2008",

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doi = "10.1109/ARFTG.2008.4804285",

language = "English",

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pages = "69 -- 72",

booktitle = "72nd ARFTG Microwave Measurement Symposium, Portland, USA",

publisher = "Institute of Electrical and Electronics Engineers (IEEE)",

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T1 - RF waveform metrology for characterization of non-linear amplifiers

AU - Humphreys, DA

AU - Watkins, GT

AU - Morris, KA

AU - Miall, J

PY - 2008/12/9

Y1 - 2008/12/9

N2 - Radio Frequency Waveform metrology (RFWM), based on real-time digital oscilloscopes, was used to evaluate the performance of a non-linear E-class amplifier optimized for WCDMA at 840 MHz. A timing error in the modulation signal gave abnormally high EVM values when measured using commercial equipment. The EVM of the source and amplifier were estimated as 0.4% and 2% respectively using RFWM. Simple RFWM evaluation tools show amplifier distortion and may offer insights over parametric measures.

AB - Radio Frequency Waveform metrology (RFWM), based on real-time digital oscilloscopes, was used to evaluate the performance of a non-linear E-class amplifier optimized for WCDMA at 840 MHz. A timing error in the modulation signal gave abnormally high EVM values when measured using commercial equipment. The EVM of the source and amplifier were estimated as 0.4% and 2% respectively using RFWM. Simple RFWM evaluation tools show amplifier distortion and may offer insights over parametric measures.

U2 - 10.1109/ARFTG.2008.4804285

DO - 10.1109/ARFTG.2008.4804285

M3 - Conference Contribution (Conference Proceeding)

SN - 9781424423002

SP - 69

EP - 72

BT - 72nd ARFTG Microwave Measurement Symposium, Portland, USA

PB - Institute of Electrical and Electronics Engineers (IEEE)

ER -

RF waveform metrology for characterization of non-linear amplifiers

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