Radio Frequency Waveform metrology (RFWM), based on real-time digital oscilloscopes, was used to evaluate the performance of a non-linear E-class amplifier optimized for WCDMA at 840 MHz. A timing error in the modulation signal gave abnormally high EVM values when measured using commercial equipment. The EVM of the source and amplifier were estimated as 0.4% and 2% respectively using RFWM. Simple RFWM evaluation tools show amplifier distortion and may offer insights over parametric measures.
|Translated title of the contribution||RF waveform metrology for characterization of non-linear amplifiers|
|Title of host publication||72nd ARFTG Microwave Measurement Symposium, Portland, USA|
|Publisher||Institute of Electrical and Electronics Engineers (IEEE)|
|Pages||69 - 72|
|Number of pages||4|
|Publication status||Published - 9 Dec 2008|