Robust TE0 + TE1 Waveguide Crossing

Pengfei Xu, Yanfeng Zhang, Yujie Chen, Siyuan Yu

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

Abstract

We proposed a silicon waveguide crossing device supporting both TE0 and TEl modes, TE0 mode insertion loss about -1 -1.2 dB and TE1 insertion loss about -0.5 -1 dB, and the crosstalk is better than -30 dB.

Original languageEnglish
Title of host publication2018 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2018
Subtitle of host publication2018, 29 July–3 August, Hong Kong, China
PublisherOptical Society of America (OSA)
ISBN (Electronic)9781943580453
DOIs
Publication statusPublished - 25 Apr 2019
Event2018 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2018 - Wanchai, Hong Kong
Duration: 29 Jul 20183 Aug 2018

Conference

Conference2018 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2018
CountryHong Kong
CityWanchai
Period29/07/183/08/18

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  • Cite this

    Xu, P., Zhang, Y., Chen, Y., & Yu, S. (2019). Robust TE0 + TE1 Waveguide Crossing. In 2018 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2018: 2018, 29 July–3 August, Hong Kong, China [8699607] Optical Society of America (OSA). https://doi.org/10.1364/CLEOPR.2018.W3A.118