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Robust TE0 + TE1 Waveguide Crossing

Pengfei Xu, Yanfeng Zhang, Yujie Chen, Siyuan Yu

    Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

    Abstract

    We proposed a silicon waveguide crossing device supporting both TE0 and TEl modes, TE0 mode insertion loss about -1 -1.2 dB and TE1 insertion loss about -0.5 -1 dB, and the crosstalk is better than -30 dB.

    Original languageEnglish
    Title of host publication2018 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2018
    Subtitle of host publication2018, 29 July–3 August, Hong Kong, China
    PublisherOptical Society of America (OSA)
    ISBN (Electronic)9781943580453
    DOIs
    Publication statusPublished - 25 Apr 2019
    Event2018 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2018 - Wanchai, Hong Kong
    Duration: 29 Jul 20183 Aug 2018

    Conference

    Conference2018 Conference on Lasers and Electro-Optics Pacific Rim, CLEO-PR 2018
    Country/TerritoryHong Kong
    CityWanchai
    Period29/07/183/08/18

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