Sample Preparation Methods for Optimal HS-AFM Analysis: Duplex Stainless Steel

Stacy Moore; Alexander D. Warren; Robert Burrows; Oliver D. Payton; Loren Picco; Freddie S. Russell-pavier; Peter G. Martin; Tomas L. Martin

doi:10.1016/j.ultramic.2021.113210

Sample Preparation Methods for Optimal HS-AFM Analysis: Duplex Stainless Steel

Stacy Moore^*, Alexander D. Warren, Robert Burrows, Oliver D. Payton, Loren Picco, Freddie S. Russell-pavier, Peter G. Martin, Tomas L. Martin

^*Corresponding author for this work

Research output: Contribution to journal › Article (Academic Journal) › peer-review

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Abstract

The contact mode high-speed atomic force microscope (AFM) operates orders of magnitude faster than conventional AFMs. It is capable of capturing multiple frames per second with nanometre-scale lateral resolution and subatomic height resolution.This advancement in imaging rate allows for microscale analysis across macroscale surfaces, making it suitable for applications across materials science. However, the quality of the surface analysis obtained by high-speed AFM is highly dependent upon the standard of sample preparation and the resultant final surface finish. In this study, different surface preparation techniques that are commonly implemented within metallurgical studies are compared for samples of SAF 2205 duplex stainless steel. It was found that, while acid etching and electrolytic etching were optimal for the low resolution of optical microscopy, these methods were less suited for analysis by high resolution high-speed AFM. Mechanical and colloidal silica polishing was found to be the optimal method explored, as it provided a gentle etch of the surface allowing for high quality topographic maps of the sample surface.

Original language	English
Article number	113210
Number of pages	18
Journal	Ultramicroscopy
Volume	222
Early online date	16 Jan 2021
DOIs	https://doi.org/10.1016/j.ultramic.2021.113210
Publication status	Published - 1 Mar 2021

Bibliographical note

Funding Information:
The authors would like to thank Dr. Peter Heard for his assistance in FIB etching, and Dr. Ian Griffiths and Mr. John Nicholson for their advice. Also, Outokumpu Stainless AB for the supply of the SAF 2205 duplex stainless steel samples. The authors would also like to thank the physics workshop and NSQI low noise labs at the University of Bristol. This work was supported by the National Nuclear Laboratory (NNL), the Engineering and Physical Sciences Research Council (EPSRC), and the Royal Academy of Engineering (RAEng).

Publisher Copyright:
© 2021

Keywords

Sample preparation
contact mode high-speed atomic force microscopy
duplex stainless steel
acid etching
electrolytic etching
focussed ion beam etching

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10.1016/j.ultramic.2021.113210

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title = "Sample Preparation Methods for Optimal HS-AFM Analysis: Duplex Stainless Steel",

abstract = "The contact mode high-speed atomic force microscope (AFM) operates orders of magnitude faster than conventional AFMs. It is capable of capturing multiple frames per second with nanometre-scale lateral resolution and subatomic height resolution.This advancement in imaging rate allows for microscale analysis across macroscale surfaces, making it suitable for applications across materials science. However, the quality of the surface analysis obtained by high-speed AFM is highly dependent upon the standard of sample preparation and the resultant final surface finish. In this study, different surface preparation techniques that are commonly implemented within metallurgical studies are compared for samples of SAF 2205 duplex stainless steel. It was found that, while acid etching and electrolytic etching were optimal for the low resolution of optical microscopy, these methods were less suited for analysis by high resolution high-speed AFM. Mechanical and colloidal silica polishing was found to be the optimal method explored, as it provided a gentle etch of the surface allowing for high quality topographic maps of the sample surface.",

keywords = "Sample preparation, contact mode high-speed atomic force microscopy, duplex stainless steel, acid etching, electrolytic etching, focussed ion beam etching",

author = "Stacy Moore and Warren, {Alexander D.} and Robert Burrows and Payton, {Oliver D.} and Loren Picco and Russell-pavier, {Freddie S.} and Martin, {Peter G.} and Martin, {Tomas L.}",

note = "Funding Information: The authors would like to thank Dr. Peter Heard for his assistance in FIB etching, and Dr. Ian Griffiths and Mr. John Nicholson for their advice. Also, Outokumpu Stainless AB for the supply of the SAF 2205 duplex stainless steel samples. The authors would also like to thank the physics workshop and NSQI low noise labs at the University of Bristol. This work was supported by the National Nuclear Laboratory (NNL), the Engineering and Physical Sciences Research Council (EPSRC), and the Royal Academy of Engineering (RAEng). Publisher Copyright: {\textcopyright} 2021",

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T2 - Duplex Stainless Steel

AU - Moore, Stacy

AU - Warren, Alexander D.

AU - Burrows, Robert

AU - Payton, Oliver D.

AU - Picco, Loren

AU - Russell-pavier, Freddie S.

AU - Martin, Peter G.

AU - Martin, Tomas L.

N1 - Funding Information: The authors would like to thank Dr. Peter Heard for his assistance in FIB etching, and Dr. Ian Griffiths and Mr. John Nicholson for their advice. Also, Outokumpu Stainless AB for the supply of the SAF 2205 duplex stainless steel samples. The authors would also like to thank the physics workshop and NSQI low noise labs at the University of Bristol. This work was supported by the National Nuclear Laboratory (NNL), the Engineering and Physical Sciences Research Council (EPSRC), and the Royal Academy of Engineering (RAEng). Publisher Copyright: © 2021

PY - 2021/3/1

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N2 - The contact mode high-speed atomic force microscope (AFM) operates orders of magnitude faster than conventional AFMs. It is capable of capturing multiple frames per second with nanometre-scale lateral resolution and subatomic height resolution.This advancement in imaging rate allows for microscale analysis across macroscale surfaces, making it suitable for applications across materials science. However, the quality of the surface analysis obtained by high-speed AFM is highly dependent upon the standard of sample preparation and the resultant final surface finish. In this study, different surface preparation techniques that are commonly implemented within metallurgical studies are compared for samples of SAF 2205 duplex stainless steel. It was found that, while acid etching and electrolytic etching were optimal for the low resolution of optical microscopy, these methods were less suited for analysis by high resolution high-speed AFM. Mechanical and colloidal silica polishing was found to be the optimal method explored, as it provided a gentle etch of the surface allowing for high quality topographic maps of the sample surface.

AB - The contact mode high-speed atomic force microscope (AFM) operates orders of magnitude faster than conventional AFMs. It is capable of capturing multiple frames per second with nanometre-scale lateral resolution and subatomic height resolution.This advancement in imaging rate allows for microscale analysis across macroscale surfaces, making it suitable for applications across materials science. However, the quality of the surface analysis obtained by high-speed AFM is highly dependent upon the standard of sample preparation and the resultant final surface finish. In this study, different surface preparation techniques that are commonly implemented within metallurgical studies are compared for samples of SAF 2205 duplex stainless steel. It was found that, while acid etching and electrolytic etching were optimal for the low resolution of optical microscopy, these methods were less suited for analysis by high resolution high-speed AFM. Mechanical and colloidal silica polishing was found to be the optimal method explored, as it provided a gentle etch of the surface allowing for high quality topographic maps of the sample surface.

KW - Sample preparation

KW - contact mode high-speed atomic force microscopy

KW - duplex stainless steel

KW - acid etching

KW - electrolytic etching

KW - focussed ion beam etching

U2 - 10.1016/j.ultramic.2021.113210

DO - 10.1016/j.ultramic.2021.113210

M3 - Article (Academic Journal)

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JO - Ultramicroscopy

JF - Ultramicroscopy

SN - 0304-3991

M1 - 113210

ER -

Sample Preparation Methods for Optimal HS-AFM Analysis: Duplex Stainless Steel

Abstract

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