Simulated Degradation of a Crystalline C-S-H Phase, (Xonotlite), by X-ray Photoelectron Spectroscopy (XPS), X-Ray Diffraction (XRD) and Environmental Scanning Electron Microscopy (ESEM)

L Black, K Garbev, P Stemmermann, KR Hallam, GC Allen

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

Translated title of the contributionSimulated Degradation of a Crystalline C-S-H Phase, (Xonotlite), by X-ray Photoelectron Spectroscopy (XPS), X-Ray Diffraction (XRD) and Environmental Scanning Electron Microscopy (ESEM)
Original languageEnglish
Title of host publication80. Jahrestagung der Deutschen Mineralogischen Gesellschaft (DMG), 8. bis 12. September 2002 Hamburg
Publication statusPublished - 2002

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