Translated title of the contribution | Simulated Degradation of a Crystalline C-S-H Phase, (Xonotlite), by X-ray Photoelectron Spectroscopy (XPS), X-Ray Diffraction (XRD) and Environmental Scanning Electron Microscopy (ESEM) |
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Original language | English |
Title of host publication | 80. Jahrestagung der Deutschen Mineralogischen Gesellschaft (DMG), 8. bis 12. September 2002 Hamburg |
Publication status | Published - 2002 |
Simulated Degradation of a Crystalline C-S-H Phase, (Xonotlite), by X-ray Photoelectron Spectroscopy (XPS), X-Ray Diffraction (XRD) and Environmental Scanning Electron Microscopy (ESEM)
L Black, K Garbev, P Stemmermann, KR Hallam, GC Allen
Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)