Simulated Degradation of a Crystalline C-S-H Phase, (Xonotlite), by X-ray
Photoelectron Spectroscopy (XPS), X-Ray Diffraction (XRD) and Environmental
Scanning Electron Microscopy (ESEM)

L Black; K Garbev; P Stemmermann; KR Hallam; GC Allen

Simulated Degradation of a Crystalline C-S-H Phase, (Xonotlite), by X-ray Photoelectron Spectroscopy (XPS), X-Ray Diffraction (XRD) and Environmental Scanning Electron Microscopy (ESEM)

L Black, K Garbev, P Stemmermann, KR Hallam, GC Allen

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Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

Translated title of the contribution	Simulated Degradation of a Crystalline C-S-H Phase, (Xonotlite), by X-ray Photoelectron Spectroscopy (XPS), X-Ray Diffraction (XRD) and Environmental Scanning Electron Microscopy (ESEM)
Original language	English
Title of host publication	80. Jahrestagung der Deutschen Mineralogischen Gesellschaft (DMG), 8. bis 12. September 2002 Hamburg
Publication status	Published - 2002

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@inproceedings{1b20743012394ae3903d5c8b15144d58,

title = "Simulated Degradation of a Crystalline C-S-H Phase, (Xonotlite), by X-ray Photoelectron Spectroscopy (XPS), X-Ray Diffraction (XRD) and Environmental Scanning Electron Microscopy (ESEM)",

author = "L Black and K Garbev and P Stemmermann and KR Hallam and GC Allen",

year = "2002",

language = "English",

booktitle = "80. Jahrestagung der Deutschen Mineralogischen Gesellschaft (DMG), 8. bis 12. September 2002 Hamburg",

}

Simulated Degradation of a Crystalline C-S-H Phase, (Xonotlite), by X-ray Photoelectron Spectroscopy (XPS), X-Ray Diffraction (XRD) and Environmental Scanning Electron Microscopy (ESEM). / Black, L; Garbev, K; Stemmermann, P et al.
80. Jahrestagung der Deutschen Mineralogischen Gesellschaft (DMG), 8. bis 12. September 2002 Hamburg. 2002.

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

TY - GEN

T1 - Simulated Degradation of a Crystalline C-S-H Phase, (Xonotlite), by X-ray Photoelectron Spectroscopy (XPS), X-Ray Diffraction (XRD) and Environmental Scanning Electron Microscopy (ESEM)

AU - Black, L

AU - Garbev, K

AU - Stemmermann, P

AU - Hallam, KR

AU - Allen, GC

PY - 2002

Y1 - 2002

M3 - Conference Contribution (Conference Proceeding)

BT - 80. Jahrestagung der Deutschen Mineralogischen Gesellschaft (DMG), 8. bis 12. September 2002 Hamburg

ER -