Simulations of sidewall profiles in reactive ion etching

PW May, D Field, DF Klemperer

Research output: Contribution to journalArticle (Academic Journal)peer-review

Translated title of the contributionSimulations of sidewall profiles in reactive ion etching
Original languageEnglish
Pages (from-to)598 - 606
Number of pages8
JournalJournal of Physics D: Applied Physics
Volume26
Publication statusPublished - 1993

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