Simultaneous measurement of optical and RF behavior under CW and pulsed Fully Active Harmonic Load-Pull

M. A. Casbon; Tommaso Brazzini; P. J. Tasker; Michael J Uren; Martin H H Kuball

doi:10.1109/ARFTG.2016.7501954

Simultaneous measurement of optical and RF behavior under CW and pulsed Fully Active Harmonic Load-Pull

M. A. Casbon
, Tommaso Brazzini
, P. J. Tasker
, Michael J Uren
, Martin H H Kuball

School of Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

1 Citation (Scopus)

331 Downloads (Pure)

Abstract

Here we present a system capable of simultaneous measurements of the RF and optical behavior of on-wafer devices, permitting the complete range of Fully Active Harmonic Load-Pull techniques to be employed while either observing optical phenomena such as Electroluminescence, or applying optical stimuli for trapping investigations. Full access to the backside of the wafer is achieved, allowing measurements on devices with source coupled field plates or air bridges, which normally obscure the gate region. Electroluminescence can be observed with an ultra-low light camera or a spectrometer. The test device was a GaN on silicon carbide HFET.

Original language	English
Title of host publication	2016 87th ARFTG Microwave Measurement Conference (ARFTG 2016)
Subtitle of host publication	Proceedings of a meeting held 27 May 2016, San Francisco, California, USA
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Number of pages	4
ISBN (Electronic)	9781509013081
ISBN (Print)	9781509013098
DOIs	https://doi.org/10.1109/ARFTG.2016.7501954
Publication status	Published - Aug 2016

Research Groups and Themes

CDTR

Keywords

fully active harmonic load-pull
power amplifiers
Waveform Engineering

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10.1109/ARFTG.2016.7501954

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Casbon, M. A., Brazzini, T., Tasker, P. J., Uren, M. J., & Kuball, M. H. H. (2016). Simultaneous measurement of optical and RF behavior under CW and pulsed Fully Active Harmonic Load-Pull. In 2016 87th ARFTG Microwave Measurement Conference (ARFTG 2016): Proceedings of a meeting held 27 May 2016, San Francisco, California, USA Article 7501954 Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/ARFTG.2016.7501954

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title = "Simultaneous measurement of optical and RF behavior under CW and pulsed Fully Active Harmonic Load-Pull",

abstract = "Here we present a system capable of simultaneous measurements of the RF and optical behavior of on-wafer devices, permitting the complete range of Fully Active Harmonic Load-Pull techniques to be employed while either observing optical phenomena such as Electroluminescence, or applying optical stimuli for trapping investigations. Full access to the backside of the wafer is achieved, allowing measurements on devices with source coupled field plates or air bridges, which normally obscure the gate region. Electroluminescence can be observed with an ultra-low light camera or a spectrometer. The test device was a GaN on silicon carbide HFET.",

keywords = "fully active harmonic load-pull, power amplifiers, Waveform Engineering",

author = "Casbon, \{M. A.\} and Tommaso Brazzini and Tasker, \{P. J.\} and Uren, \{Michael J\} and Kuball, \{Martin H H\}",

year = "2016",

month = aug,

doi = "10.1109/ARFTG.2016.7501954",

language = "English",

isbn = "9781509013098",

booktitle = "2016 87th ARFTG Microwave Measurement Conference (ARFTG 2016)",

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Casbon, MA, Brazzini, T, Tasker, PJ, Uren, MJ & Kuball, MHH 2016, Simultaneous measurement of optical and RF behavior under CW and pulsed Fully Active Harmonic Load-Pull. in 2016 87th ARFTG Microwave Measurement Conference (ARFTG 2016): Proceedings of a meeting held 27 May 2016, San Francisco, California, USA., 7501954, Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/ARFTG.2016.7501954

Simultaneous measurement of optical and RF behavior under CW and pulsed Fully Active Harmonic Load-Pull. / Casbon, M. A.; Brazzini, Tommaso; Tasker, P. J. et al.
2016 87th ARFTG Microwave Measurement Conference (ARFTG 2016): Proceedings of a meeting held 27 May 2016, San Francisco, California, USA. Institute of Electrical and Electronics Engineers (IEEE), 2016. 7501954.

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

TY - GEN

T1 - Simultaneous measurement of optical and RF behavior under CW and pulsed Fully Active Harmonic Load-Pull

AU - Casbon, M. A.

AU - Brazzini, Tommaso

AU - Tasker, P. J.

AU - Uren, Michael J

AU - Kuball, Martin H H

PY - 2016/8

Y1 - 2016/8

N2 - Here we present a system capable of simultaneous measurements of the RF and optical behavior of on-wafer devices, permitting the complete range of Fully Active Harmonic Load-Pull techniques to be employed while either observing optical phenomena such as Electroluminescence, or applying optical stimuli for trapping investigations. Full access to the backside of the wafer is achieved, allowing measurements on devices with source coupled field plates or air bridges, which normally obscure the gate region. Electroluminescence can be observed with an ultra-low light camera or a spectrometer. The test device was a GaN on silicon carbide HFET.

AB - Here we present a system capable of simultaneous measurements of the RF and optical behavior of on-wafer devices, permitting the complete range of Fully Active Harmonic Load-Pull techniques to be employed while either observing optical phenomena such as Electroluminescence, or applying optical stimuli for trapping investigations. Full access to the backside of the wafer is achieved, allowing measurements on devices with source coupled field plates or air bridges, which normally obscure the gate region. Electroluminescence can be observed with an ultra-low light camera or a spectrometer. The test device was a GaN on silicon carbide HFET.

KW - fully active harmonic load-pull

KW - power amplifiers

KW - Waveform Engineering

UR - https://www.scopus.com/pages/publications/84979545288

U2 - 10.1109/ARFTG.2016.7501954

DO - 10.1109/ARFTG.2016.7501954

M3 - Conference Contribution (Conference Proceeding)

AN - SCOPUS:84979545288

SN - 9781509013098

BT - 2016 87th ARFTG Microwave Measurement Conference (ARFTG 2016)

PB - Institute of Electrical and Electronics Engineers (IEEE)

ER -

Casbon MA, Brazzini T, Tasker PJ, Uren MJ , Kuball MHH. Simultaneous measurement of optical and RF behavior under CW and pulsed Fully Active Harmonic Load-Pull. In 2016 87th ARFTG Microwave Measurement Conference (ARFTG 2016): Proceedings of a meeting held 27 May 2016, San Francisco, California, USA. Institute of Electrical and Electronics Engineers (IEEE). 2016. 7501954 Epub 2016 Jun 30. doi: 10.1109/ARFTG.2016.7501954

Simultaneous measurement of optical and RF behavior under CW and pulsed Fully Active Harmonic Load-Pull

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