Single-event charge collection and upset in 40-nm dual-and triple-well bulk CMOS SRAMs

Indranil Chatterjee, Balaji Narasimham, Nihaar N Mahatme, Bharat L Bhuva, Ronald D Schrimpf, Jung K Wang, Bartz Bartz, Eswara Pitta, Myron Buer

Research output: Contribution to journalArticle (Academic Journal)peer-review

35 Citations (Scopus)
Original languageEnglish
Pages (from-to)2761-2767
Number of pages7
JournalIEEE Transactions on Nuclear Science
Issue number6
Publication statusPublished - 2011

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