Single Event Upset in Dual- and Triple-Well SRAMs: Radiation-induced Charge Collection Mechanisms in sub-90nm Dual- and Triple-well CMOS SRAMs

Research output: Book/Report › Authored book

Original language	English
Publisher	Lambert Academic Publishing
Publication status	Published - 2012

Handle.net

TY - BOOK

T1 - Single Event Upset in Dual- and Triple-Well SRAMs: Radiation-induced Charge Collection Mechanisms in sub-90nm Dual- and Triple-well CMOS SRAMs

AU - Chatterjee, Indranil

PY - 2012

Y1 - 2012

M3 - Authored book

BT - Single Event Upset in Dual- and Triple-Well SRAMs: Radiation-induced Charge Collection Mechanisms in sub-90nm Dual- and Triple-well CMOS SRAMs

PB - Lambert Academic Publishing

ER -