Solid immersion facilitates fluorescence microscopy with nanometer resolution and sub-ångström emitter localization

Dominik Wildanger, Brian R Patton, Heiko Schill, Luca Marseglia, J P Hadden, Sebastian Knauer, Andreas Schönle, John G Rarity, Jeremy L O'Brien, Stefan W Hell, Jason M Smith

Research output: Contribution to journalArticle (Academic Journal)peer-review

90 Citations (Scopus)
502 Downloads (Pure)

Abstract

Exploring the maximum spatial resolution achievable in far-field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm.
Original languageEnglish
Pages (from-to)OP309-13
Number of pages5
JournalAdvanced Materials
Volume24
Issue number44
DOIs
Publication statusPublished - 20 Nov 2012

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