Solid immersion facilitates fluorescence microscopy with nanometer resolution and sub-ångström emitter localization

Dominik Wildanger; Brian R Patton; Heiko Schill; Luca Marseglia; J P Hadden; Sebastian Knauer; Andreas Schönle; John G Rarity; Jeremy L O'Brien; Stefan W Hell; Jason M Smith

doi:10.1002/adma.201203033

Solid immersion facilitates fluorescence microscopy with nanometer resolution and sub-ångström emitter localization

Dominik Wildanger, Brian R Patton, Heiko Schill, Luca Marseglia, J P Hadden, Sebastian Knauer, Andreas Schönle, John G Rarity, Jeremy L O'Brien, Stefan W Hell, Jason M Smith

Research output: Contribution to journal › Article (Academic Journal) › peer-review

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Abstract

Exploring the maximum spatial resolution achievable in far-field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm.

Original language	English
Pages (from-to)	OP309-13
Number of pages	5
Journal	Advanced Materials
Volume	24
Issue number	44
DOIs	https://doi.org/10.1002/adma.201203033
Publication status	Published - 20 Nov 2012

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QETLabs
Photonics and Quantum

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10.1002/adma.201203033

Wildanger et alFinal published version, 917 KB

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PHOTONIC QUANTUM TECHNOLOGIES
O'Brien, J. L. (Principal Investigator)
1/09/07 → 1/09/12
Project: Research
NANOENGINEERED DIAMOND FOR QUANTUM INFORMATION TECHNOLOGY (NEDQIT)
Rarity, J. G. (Principal Investigator)
1/07/07 → 1/07/10
Project: Research

Cite this

@article{9a10b24efa2e4a879f9b18fadb8a89b2,

title = "Solid immersion facilitates fluorescence microscopy with nanometer resolution and sub-{\aa}ngstr{\"o}m emitter localization",

abstract = "Exploring the maximum spatial resolution achievable in far-field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm.",

author = "Dominik Wildanger and Patton, {Brian R} and Heiko Schill and Luca Marseglia and Hadden, {J P} and Sebastian Knauer and Andreas Sch{\"o}nle and Rarity, {John G} and O'Brien, {Jeremy L} and Hell, {Stefan W} and Smith, {Jason M}",

note = "Copyright {\textcopyright} 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.",

year = "2012",

month = nov,

day = "20",

doi = "10.1002/adma.201203033",

language = "English",

volume = "24",

pages = "OP309--13",

journal = "Advanced Materials",

issn = "1521-4095",

publisher = "Wiley",

number = "44",

}

TY - JOUR

T1 - Solid immersion facilitates fluorescence microscopy with nanometer resolution and sub-ångström emitter localization

AU - Wildanger, Dominik

AU - Patton, Brian R

AU - Schill, Heiko

AU - Marseglia, Luca

AU - Hadden, J P

AU - Knauer, Sebastian

AU - Schönle, Andreas

AU - Rarity, John G

AU - O'Brien, Jeremy L

AU - Hell, Stefan W

AU - Smith, Jason M

PY - 2012/11/20

Y1 - 2012/11/20

N2 - Exploring the maximum spatial resolution achievable in far-field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm.

AB - Exploring the maximum spatial resolution achievable in far-field optical imaging, we show that applying solid immersion lenses (SIL) in stimulated emission depletion (STED) microscopy addresses single spins with a resolution down to 2.4 ± 0.3 nm and with a localization precision of 0.09 nm.

U2 - 10.1002/adma.201203033

DO - 10.1002/adma.201203033

M3 - Article (Academic Journal)

C2 - 22968917

SN - 1521-4095

VL - 24

SP - OP309-13

JO - Advanced Materials

JF - Advanced Materials

IS - 44

ER -

Solid immersion facilitates fluorescence microscopy with nanometer resolution and sub-ångström emitter localization

Abstract

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PHOTONIC QUANTUM TECHNOLOGIES

NANOENGINEERED DIAMOND FOR QUANTUM INFORMATION TECHNOLOGY (NEDQIT)

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