Some applications of synchrotron X-ray reticulography for the rapid quantitative assessment of crystal lattice perfection in natural diamonds

AR Lang, APW Makepeace

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

Translated title of the contributionSome applications of synchrotron X-ray reticulography for the rapid quantitative assessment of crystal lattice perfection in natural diamonds
Original languageEnglish
Title of host publicationDiamond Conference 2003, Cambridge
Pages101 - 101
Number of pages1
Publication statusPublished - 2003

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