| Translated title of the contribution | Some applications of synchrotron X-ray reticulography for the rapid quantitative assessment of crystal lattice perfection in natural diamonds |
|---|---|
| Original language | English |
| Title of host publication | Diamond Conference 2003, Cambridge |
| Pages | 101 - 101 |
| Number of pages | 1 |
| Publication status | Published - 2003 |
Some applications of synchrotron X-ray reticulography for the rapid quantitative assessment of crystal lattice perfection in natural diamonds
AR Lang, APW Makepeace
Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)