SPM 2002 - Proceedings of the Fourth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures - Las Vegas, Nevada, USA, May 26-29, 2002

DP Allison; JKH Hoerber

SPM 2002 - Proceedings of the Fourth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures - Las Vegas, Nevada, USA, May 26-29, 2002

DP Allison, JKH Hoerber

School of Physics

Research output: Contribution to journal › Article (Academic Journal) › peer-review

Translated title of the contribution	SPM 2002 - Proceedings of the Fourth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures - Las Vegas, Nevada, USA, May 26-29, 2002
Original language	English
Pages (from-to)	Preface
Number of pages	1
Journal	Ultramicroscopy
Volume	97(1-4)
Publication status	Published - 2003

Bibliographical note

Publisher: Elsevier Science, BV
Other: Editorial Material

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Cite this

@article{be3534f733604409b8cf8a78fedc1b7e,

title = "SPM 2002 - Proceedings of the Fourth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures - Las Vegas, Nevada, USA, May 26-29, 2002",

author = "DP Allison and JKH Hoerber",

note = "Publisher: Elsevier Science, BV Other: Editorial Material",

year = "2003",

language = "English",

volume = "97(1-4)",

pages = "Preface",

journal = "Ultramicroscopy",

publisher = "Amsterdam:Elsevier",

}

TY - JOUR

T1 - SPM 2002 - Proceedings of the Fourth International Conference on Scanning Probe Microscopy, Sensors and Nanostructures - Las Vegas, Nevada, USA, May 26-29, 2002

AU - Allison, DP

AU - Hoerber, JKH

N1 - Publisher: Elsevier Science, BV Other: Editorial Material

PY - 2003

Y1 - 2003

M3 - Article (Academic Journal)

VL - 97(1-4)

SP - Preface

JO - Ultramicroscopy

JF - Ultramicroscopy

ER -