Stacking fault symmetry in epitaxial films of MOCVD ZnSe/GaAs(001)

JL Batstone, JW Steeds, PJ Wright

Research output: Contribution to journalArticle (Academic Journal)

Translated title of the contributionStacking fault symmetry in epitaxial films of MOCVD ZnSe/GaAs(001)
Original languageEnglish
Pages (from-to)609 - 620
Number of pages11
JournalUltramicroscopy Phil Mag A
VolumeA66
Publication statusPublished - 1992

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