Statistical wavelet subband modelling for texture classification

Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

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Abstract

Simple wavelet and wavelet packet transforms have often been used for texture characterisation through the analysis of spatial-frequency content. However, most previous methods make no use of any statistical analysis of the transforms' subbands. A novel method is now presented for modelling the multivariate distributions of subband coefficients by considering spatially related coefficients. The Bhattacharya and divergence metrics are then used to produce an improved texture classification method for the application to content based image retrieval.
Translated title of the contributionStatistical Wavelet Subband Modelling for Texture Classification
Original languageEnglish
Title of host publicationICIP 2001
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages165 - 168
Volume1
ISBN (Print)0780367251
DOIs
Publication statusPublished - Oct 2001
EventInternational Conference on Image Processing, 2001 (ICIP 2001) - Thessaloniki, Greece
Duration: 1 Oct 2001 → …

Conference

ConferenceInternational Conference on Image Processing, 2001 (ICIP 2001)
CountryGreece
CityThessaloniki
Period1/10/01 → …

Bibliographical note

Rose publication type: Conference contribution

Terms of use: Copyright © 2001 IEEE. Reprinted from International Conference on Image Processing, 2001 (ICIP2001).

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