Skip to main navigation Skip to search Skip to main content

Statistical wavelet subband modelling for texture classification

    Research output: Chapter in Book/Report/Conference proceedingConference Contribution (Conference Proceeding)

    1 Citation (Scopus)
    393 Downloads (Pure)

    Abstract

    Simple wavelet and wavelet packet transforms have often been used for texture characterisation through the analysis of spatial-frequency content. However, most previous methods make no use of any statistical analysis of the transforms' subbands. A novel method is now presented for modelling the multivariate distributions of subband coefficients by considering spatially related coefficients. The Bhattacharya and divergence metrics are then used to produce an improved texture classification method for the application to content based image retrieval.
    Translated title of the contributionStatistical Wavelet Subband Modelling for Texture Classification
    Original languageEnglish
    Title of host publicationICIP 2001
    PublisherInstitute of Electrical and Electronics Engineers (IEEE)
    Pages165 - 168
    Volume1
    ISBN (Print)0780367251
    DOIs
    Publication statusPublished - Oct 2001
    EventInternational Conference on Image Processing, 2001 (ICIP 2001) - Thessaloniki, Greece
    Duration: 1 Oct 2001 → …

    Conference

    ConferenceInternational Conference on Image Processing, 2001 (ICIP 2001)
    Country/TerritoryGreece
    CityThessaloniki
    Period1/10/01 → …

    Bibliographical note

    Rose publication type: Conference contribution

    Terms of use: Copyright © 2001 IEEE. Reprinted from International Conference on Image Processing, 2001 (ICIP2001).

    This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of the University of Bristol's products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to [email protected].

    By choosing to view this document, you agree to all provisions of the copyright laws protecting it.

    Fingerprint

    Dive into the research topics of 'Statistical wavelet subband modelling for texture classification'. Together they form a unique fingerprint.

    Cite this