Stress transfer in two-phase polymer systems analyzed using synchrotron microfocus X-ray diffraction

RJ Young, SJ Eichhorn, YT Shyng, C Riekel, RJ Davies

Department of Aerospace Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference Contribution (Conference Proceeding)

Original language	Undefined/Unknown
Title of host publication	ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY
Pages	U3510-U3511
Volume	230
Publication status	Published - 1 Aug 2005

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Cite this

Young, RJ., Eichhorn, SJ., Shyng, YT., Riekel, C., & Davies, RJ. (2005). Stress transfer in two-phase polymer systems analyzed using synchrotron microfocus X-ray diffraction. In ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY (Vol. 230, pp. U3510-U3511) http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2SrcApp=PARTNER_APPSrcAuth=LinksAMRKeyUT=WOS:000236797307025DestLinkType=FullRecordDestApp=ALL_WOSUsrCustomerID=0326ddbefd13eaffce8024ca57cffb07

@inproceedings{debdb41b2e1740f69c08a32221a66e23,

title = "Stress transfer in two-phase polymer systems analyzed using synchrotron microfocus X-ray diffraction",

author = "RJ Young and SJ Eichhorn and YT Shyng and C Riekel and RJ Davies",

year = "2005",

month = aug,

day = "1",

language = "Undefined/Unknown",

volume = "230",

pages = "U3510--U3511",

booktitle = "ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY",

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Young, RJ, Eichhorn, SJ, Shyng, YT, Riekel, C & Davies, RJ 2005, Stress transfer in two-phase polymer systems analyzed using synchrotron microfocus X-ray diffraction. in ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY. vol. 230, pp. U3510-U3511. <http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2SrcApp=PARTNER_APPSrcAuth=LinksAMRKeyUT=WOS:000236797307025DestLinkType=FullRecordDestApp=ALL_WOSUsrCustomerID=0326ddbefd13eaffce8024ca57cffb07>