Structural Comparison of n-Type and p-Type LaAlO3/SrTiO3 Interfaces

Ryosuke Yamamoto*, Christopher Bell, Yasuyuki Hikita, Harold Y. Hwang, Hiroyuki Nakamura, Tsuyoshi Kimura, Yusuke Wakabayashi, Chris Bell

*Corresponding author for this work

Research output: Contribution to journalArticle (Academic Journal)peer-review

55 Citations (Scopus)


Using a surface x-ray diffraction technique, we investigated the atomic structure of two types of interfaces between LaAlO3 and SrTiO3, that is, p-type (SrO/AlO2) and n-type (TiO2/LaO) interfaces. Our results demonstrate that the SrTiO3 in the sample with the n-type interface has a large polarized region, while that with the p-type interface has a limited polarized region. In addition, atomic intermixing was observed to extend deeper into the SrTiO3 substrate at the n-type interface compared to the p type. These differences result in distinct degrees of band bending, which likely contributes to the striking contrast in electrical conductivity between the two types of interfaces.

Original languageEnglish
Article number036104
Number of pages4
JournalPhysical Review Letters
Issue number3
Publication statusPublished - 15 Jul 2011

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