TY - JOUR
T1 - Structural Comparison of n-Type and p-Type LaAlO3/SrTiO3 Interfaces
AU - Yamamoto, Ryosuke
AU - Bell, Christopher
AU - Hikita, Yasuyuki
AU - Hwang, Harold Y.
AU - Nakamura, Hiroyuki
AU - Kimura, Tsuyoshi
AU - Wakabayashi, Yusuke
AU - Bell, Chris
PY - 2011/7/15
Y1 - 2011/7/15
N2 - Using a surface x-ray diffraction technique, we investigated the atomic structure of two types of interfaces between LaAlO3 and SrTiO3, that is, p-type (SrO/AlO2) and n-type (TiO2/LaO) interfaces. Our results demonstrate that the SrTiO3 in the sample with the n-type interface has a large polarized region, while that with the p-type interface has a limited polarized region. In addition, atomic intermixing was observed to extend deeper into the SrTiO3 substrate at the n-type interface compared to the p type. These differences result in distinct degrees of band bending, which likely contributes to the striking contrast in electrical conductivity between the two types of interfaces.
AB - Using a surface x-ray diffraction technique, we investigated the atomic structure of two types of interfaces between LaAlO3 and SrTiO3, that is, p-type (SrO/AlO2) and n-type (TiO2/LaO) interfaces. Our results demonstrate that the SrTiO3 in the sample with the n-type interface has a large polarized region, while that with the p-type interface has a limited polarized region. In addition, atomic intermixing was observed to extend deeper into the SrTiO3 substrate at the n-type interface compared to the p type. These differences result in distinct degrees of band bending, which likely contributes to the striking contrast in electrical conductivity between the two types of interfaces.
U2 - 10.1103/PhysRevLett.107.036104
DO - 10.1103/PhysRevLett.107.036104
M3 - Article (Academic Journal)
C2 - 21838380
SN - 0031-9007
VL - 107
JO - Physical Review Letters
JF - Physical Review Letters
IS - 3
M1 - 036104
ER -