Conducting polymers have shown great potential for application in electronic devices. A major challenge in such applications is to control the supramolecular structures these materials form to optimise the functionality. In this work we probe the structure of oligo(aniline) thin films (of sub-m thickness) drop cast on a silicon substrate using synchrotron surface diffraction. Self-assembly was induced through doping with an acid surfactant, bis(ethyl hexyl) phosphate (BEHP), resulting in the formation of well-ordered lamellae with the d-spacing ranging from 2.15 nm to 2.35 nm. The exact structural characteristics depended both on the oligomer chain length and film thickness, as well as the doping ratio. Complementary UV/Vis spectroscopy measurements confirm that such thin films retain their bulk electronic properties. Our results point to a simple and effective ionic self-assembly approach to prepare thin films with well-defined structures by tailoring parameters such as the oligomer molecular architecture, the nanofilm composition and the interfacial roughness.
|Translated title of the contribution||Structured Oligo(aniline) Nanofilms via Ionic Self-Assembly (Front Cover)|
|Article number||(cover picture)|
|Pages (from-to)||2824 - 2832|
|Number of pages||9|
|Publication status||Published - Mar 2012|